11:30 AM - 11:45 AM
[16a-Z33-9] The effect of probe contact on basic memory characteristics in Pt/Nb:STO resistive memories
Keywords:Nb:STO, data retention, direct contact
Oral presentation
6 Thin Films and Surfaces » 6.3 Oxide electronics
Tue. Mar 16, 2021 9:00 AM - 12:00 PM Z33 (Z33)
Hisashi Shima(AIST), Atsushi Fukuchi(Hokkaido Univ.)
11:30 AM - 11:45 AM
Keywords:Nb:STO, data retention, direct contact