[17a-P08-1~5] 6.6 Probe Microscopy

[17a-P08-5] X-ray energy dependence of a Ge quantum dot image by XANAM

〇Shushi Suzuki¹, Shingo MUKAI², Wang Jae CHUN³, Masaharu NOMURA⁴, Syuntarou FUJIMORI¹, Mitsuhisa IKEDA¹, Katsunori MAKIHARA¹, Seiichi MIYAZAKI¹, Kiyotaka ASAKURA² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

Keywords:NC-AFM, Elemental Analysis, Germanium

We have developed X-ray aided noncontact atomic force microscope (XANAM) that combines NC-AFM and synchrotron radiation X-rays to study chemical analysis of a sample surface at the nanoscale. We previously reported that Ge quantum dots under X-ray irradiation could be imaged at the nanoscale. In the present study, we report results on the X-ray energy dependence of Ge quantum dot images and discuss the origin of X-ray induced force change and possibly-achievable spatially-resolution for XANAM imaging.