[18a-Z08-1~11] 3.12 ナノ領域光科学･近接場光学

▲ [18a-Z08-9] Length controlled AFM-AgNW probes for tip-enhanced Raman Scattering

〇(M2)Li Jiangtao¹、Wen Han¹、Inose Tomoko²、Hirai Kenji¹、Uji-i Hiroshi^1,3 (1.Hokkaido Univ.、2.Kyoto Univ.、3.KU Leuven)

キーワード：Raman, TERS

Tip-enhanced Raman scattering (TERS) is a unique analytical tool to provide complementary chemical and topographic information of surfaces with nanometric resolution. Due to the high resolution and sensitivity, TERS is suitable for the investigation of nanoscale heterogeneity of nanomaterials. Despite the promising performance of TERS in nanoscopic spectroscopy, the fabrication of a reliable TERS probe is still difficult. In that context, we developed the method to attach silver nanowires (AgNW) on atomic force microscopy (AFM) cantilever, denoted as AFM-AgNW TERS probe. The AFM-AgNW TERS probe shows high reproducibility and TERS activity. Due to the shifting and deviation of the nanowire, TERS signals from the AFM-AgNW probe in which AgNW longer than 5 µm is extended from the top of the AFM cantilever, is unstable. In other words, the length of AgNWs is vital to obtain stable TERS signals; however, their length is uncontrollable in chemical synthesis. Thus, we developed the method to control the length of AgNW attached to the AFM cantilever to fabricate the promising AFM-AgNW TERS probe.