Keywords:Mid-IR Cr:ZnS Laser, Pulse Characterization, Spectral Phase Measurement
We present the development of a two-dimensional spectral shearing interferometry (2DSI) setup to retrieve the electric-field waveforms of mode-locked Cr:ZnS laser pulses. In the recent past, chromium-doped chalcogenides were found to have superior properties as gain media that enable ultrashort mid-infrared pulse generation. However, pulse characterization via a direct spectral phase measurement has not been realized. To construct the 2DSI setup we utilize Germanium and Silver Thiogallate as dispersive and nonlinear media, respectively. We succeed in the pulse characterization of femtosecond pulses with pulse energies as low as 2 nJ. To the best of our knowledge, this is the first demonstration of a direct spectral phase measurement for Cr:ZnS and Cr:ZnSe lasers.
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