The 68th JSAP Spring Meeting 2021

Presentation information

Oral presentation

21 Joint Session K "Wide bandgap oxide semiconductor materials and devices" » 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

[19p-Z33-1~16] 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

Fri. Mar 19, 2021 1:30 PM - 6:00 PM Z33 (Z33)

Yasuaki Ishikawa(Aoyama Gakuin Univ.), Kohei Fujiwara(Tohoku Univ.), Akifumi Matsuda(Tokyo Tech)

1:30 PM - 1:45 PM

[19p-Z33-1] Digitalized Mist-Chemical Vapor Deposition of atomic-layer Molybdenum Disulfide (MoS2) Flakes at Low Temperatures

〇(D)Abdul A Kuddus1, Arifuzzaman Rajib1, Shimomura Kazushi1, Yokoyama Kojun1, Keiji Ueno1 (1.Saitama University)

Keywords:Mist-CVD, Transitional metal dichalcogenide, Molybdenum disulfide

In this work, to make a profound understanding and explore the nucleation and growth mechanism of mist-CVD fabricated MoS2, a new controllable digitalized mist-CVD technique has been investigated systematically. Ammonium tetrathiomolybdate (NH4)2MoS4 and N-methyl-2-pyrrolidone (NMP) was used as a precursor and solvent respectively. The prepared solution was supplied into the reaction tube sequentially for several tens of seconds for a different number of cycles with Ar as generation and carrier gas containing H2 (25%) at furnace temperature of 400-600 °C. The fabrication of MoS2 was performed on the precleaned SiO2(90 nm)/Si substrate placed at the highest temperature region into the reaction tube. Finally, the sulfur treatment was executed for further improving the quality of the flakes at the temperature of 600 °C for 20 min. The experimental results reveal that the digitalized mist-CVD is much promising technique for the controlled fabrication of high-quality atomic-layer 2H-MoS2 at low temperatures.