2021年第68回応用物理学会春季学術講演会

講演情報

一般セッション(口頭講演)

21 合同セッションK「ワイドギャップ酸化物半導体材料・デバイス」 » 21.1 合同セッションK 「ワイドギャップ酸化物半導体材料・デバイス」

[19p-Z33-1~16] 21.1 合同セッションK 「ワイドギャップ酸化物半導体材料・デバイス」

2021年3月19日(金) 13:30 〜 18:00 Z33 (Z33)

石河 泰明(青学大)、藤原 宏平(東北大)、松田 晃史(東工大)

13:30 〜 13:45

[19p-Z33-1] Digitalized Mist-Chemical Vapor Deposition of atomic-layer Molybdenum Disulfide (MoS2) Flakes at Low Temperatures

〇(D)Abdul A Kuddus1、Arifuzzaman Rajib1、Shimomura Kazushi1、Yokoyama Kojun1、Keiji Ueno1 (1.Saitama University)

キーワード:Mist-CVD, Transitional metal dichalcogenide, Molybdenum disulfide

In this work, to make a profound understanding and explore the nucleation and growth mechanism of mist-CVD fabricated MoS2, a new controllable digitalized mist-CVD technique has been investigated systematically. Ammonium tetrathiomolybdate (NH4)2MoS4 and N-methyl-2-pyrrolidone (NMP) was used as a precursor and solvent respectively. The prepared solution was supplied into the reaction tube sequentially for several tens of seconds for a different number of cycles with Ar as generation and carrier gas containing H2 (25%) at furnace temperature of 400-600 °C. The fabrication of MoS2 was performed on the precleaned SiO2(90 nm)/Si substrate placed at the highest temperature region into the reaction tube. Finally, the sulfur treatment was executed for further improving the quality of the flakes at the temperature of 600 °C for 20 min. The experimental results reveal that the digitalized mist-CVD is much promising technique for the controlled fabrication of high-quality atomic-layer 2H-MoS2 at low temperatures.