HUIQIN ZHOU

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Speaker, Author, Co-Author

Tue. Sep 20, 2022 9:00 AM - 12:00 PM C306 (C306)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[20a-C306-1~11] 15.6 Group IV Compound Semiconductors (SiC)

11:15 AM - 11:30 AM

▼ [20a-C306-9] Analysis of Inclusion Defect Generation in SiC Solution Crystal Growth Method Using Phase-Field Model

〇(D)HUIQIN ZHOU¹, YUMA FUKAMI¹, YIFAN DANG¹, Shunta Harada^1,2, Miho Tagawa^1,2, Toru Ujihara^1,2 (1.Grad. School of Eng. Nagoya Univ., 2.IMaSS, Nagoya Univ.)

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