The 83rd JSAP Autumn Meeting 2022

Presentation information

Oral presentation

8 Plasma Electronics » 8.1 Plasma production and diagnostics

[20p-A105-1~11] 8.1 Plasma production and diagnostics

Tue. Sep 20, 2022 2:00 PM - 5:00 PM A105 (A105)

Daisuke Ogawa(Chubu Univ.), Kentaro Tomita(Hokkaido Univ.)

2:15 PM - 2:30 PM

[20p-A105-2] Passive monitoring of specific particle species in 860 MHz surface wave plasma for plasma CVD/ALD

Miharu Niimoto1, Akio Sanpei1, Haruhiko Himura1, Takaya Ninomiya1, Shinichiro Inagaki1 (1.KIT)

Keywords:spectroscopy, plasma process, image diagnostic

In the plasma process, uniformity of plasma in deposition is required. Therefore, image diagnostic was used as a method to instantaneously obtain a three-dimensional distribution without affecting the plasma. The three-dimensional distribution of the plasma can be obtained by reconstructing an image of the plasma taken from one direction. In this study, we measured plasmas generated by two types of gases for the purpose of acquiring three-dimensional images of ions and radicals that contribute to the process in the gas mixture.