[21p-C206-1~13] 7.1 X-ray technologies

[21p-C206-9] Feasibility study of DXAFS using deformable crystal at SAGA-LS

〇Akio Yoneyama¹, Hiroyuki Setoyama¹, Masahide Kawamoto¹, Yoshio Ichii² (1.SAGA Light Source, 2.JTEC Corp.)

Keywords:XAFS, DXAFS, deformable crystal

We are constructing an Energy Dispersive XAFS (DXAFS) measurement system using a "deformable crystal" mechanism in which the shape of the curved crystal can be adjusted by a piezoelectric element for one-shot measurement of X-ray absorption spectra at SAGA LS. Feasibility study of the system showed that the spectra of Zr can be obtained with an exposure time of 10 ms using white synchrotron radiation focused at 70 microns.