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[22a-C200-1] Characterizations of microstructures in semipolar (10-13) AlN epilayer
Keywords:AlN, semipolar
We have developed a new growth technique, named ammonia-free high temperature MOCVD. We succeeded in growing high quality semipolar (10-13) AlN epilayer on m-plane sapphire substrates by the technique, which is extremely difficult by using conventional growth techniques. In this presentation, we report the microstructure characterization results in the semipolar AlN epilayer.