Detection of ionic impurities in vapor-deposited organic thin films by displacement current measurement method

Takuro Iwata; Masaru Inoue; Noriaki Oyabu; Keisuke Ohdaira; Hideyuki Murata

Presentation information

Oral presentation

12 Organic Molecules and Bioelectronics » 12.4 Organic light-emitting devices and organic transistors

[22p-B104-1~14] 12.4 Organic light-emitting devices and organic transistors

Thu. Sep 22, 2022 1:30 PM - 5:30 PM B104 (B104)

Hajime Nakanotani(Kyushu Univ.), Yutaka Noguchi(Meiji Univ.), Yuya Tanaka(Chiba Univ.)

2:00 PM - 2:15 PM

[22p-B104-3] Detection of ionic impurities in vapor-deposited organic thin films by displacement current measurement method

〇(M2)Takuro Iwata¹, Masaru Inoue², Noriaki Oyabu³, Keisuke Ohdaira¹, Hideyuki Murata¹ (1.JAIST, 2.TOYOTech, 3.TOYO Corporation)

Keywords:Organic materials, Displacement current measurement, Ion impurities

In this study, we have succeeded in detecting the amount of ions in the thin films of a hole transport material for OLED using the displacement current measurement (DCM).We were also able to quantitatively evaluate the reduction of ionic impurities by refining the organic materials. This method can be applied to the purity evaluation of OLED materials.