[23p-C102-1~14] 13.3 Insulator technology

△ [23p-C102-7] Relationship between the stacking order of monatomic layers in LaAlO₃ dipole layer and the dipole direction at the perovskite oxide epitaxial interface verified by lateral force microscopy

〇Atsushi Tamura¹, Koji Kita^1,2 (1.Dept. of Materials Engineering, Univ. of Tokyo, 2.Dept. of Advanced Materials Science, Univ. of Tokyo)

Keywords:dipole, perovskite, lateral force microscopy

In this study, the relationship between the interfacial dipole effect and the LaAlO₃ (LAO) stacking order was verified by lateral force microscopy, which measures the frictional force depending on the surface terminating atoms on the samples. In the LAO/(SrAlO_x(SAO))/SrRuO₃ stack, a difference in surface termination with and without SAO insertion was found, suggesting modulation of the LAO stacking order. Together with the measurement of dipole orientation by cutoff energy measurement, it was verified that the interfacial dipole layer stacking order determines the dipole layer formation.