The 69th JSAP Spring Meeting 2022

Presentation information

Symposium (Oral)

Symposium » Imaging by using from visible light to X-rays - Exploring its versatility-

[22a-E304-1~6] Imaging by using from visible light to X-rays - Exploring its versatility-

Tue. Mar 22, 2022 9:00 AM - 11:35 AM E304 (E304)

Hiroki Wadati(Univ. of Hyogo)

10:50 AM - 11:20 AM

[22a-E304-5] Imaging and analysis of thin film layers using diagonal cutting with SAICAS

〇Ryo Sato1 (1.NIPPON STEEL TECHNOLOGY)

Keywords:Surface And Interfacial Cutting Analysis System, Surface analysis, Battery material analysis

表面界面切削解析装置(SAICAS)による低角度斜め切削面の各種表面分析装置によるイメージング技術をご紹介します。