2022年第69回応用物理学会春季学術講演会

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6 薄膜・表面 » 6.3 酸化物エレクトロニクス

[22p-E204-1~13] 6.3 酸化物エレクトロニクス

2022年3月22日(火) 13:30 〜 17:00 E204 (E204)

田中 貴久(東大)、岡 大地(東北大)

16:00 〜 16:15

[22p-E204-10] Investigation of Deep-level Defects in β-Ga2O3 (001) Schottky Barrier Diode
by Transient Photocapacitance Spectroscopy

〇(D)Fenfen Fenda Florena1、Aboulaye Traore1、Takeaki Sakurai1 (1.Univ. of Tsukuba)

キーワード:gallium oxide, wide band gap materials, deep-levels

β-Ga2O3 is an emerging ultrawide semiconductor for high-power applications due to its outstanding intrinsic properties. Indeed, β-Ga2O3 has a large bandgap (4.5−4.8 eV), high breakdown field (~8 MV/cm), and high Baliga’s figure of merit (BFOM) (3000). BFOM describes a trade-off relationship between breakdown voltage and on-resistance. At this early stage of development, the investigation of deep levels in β-Ga2O3 and their effects on the device’s electrical properties are crucial for the achievement of high-performance devices. Among optical spectroscopy techniques, transient photocapacitance (TPC) spectroscopy is one of the most effective methods of revealing deep-level defects in materials because of the very low detection limit. In this work, deep-level defects within β-Ga2O3 detected by TPC spectroscopy were reported. The spectral dependence of the optical cross-section of photoionized deep level defects was measured and fitted by several models.