[22p-P04-1~4] 7 Beam Technology and Nanofabrication(Poster)

[22p-P04-2] Change of propagating path of glancing incident X-ray by contact between two solids

〇Taiki Nakajima¹, Tokujiro Yamamoto¹ (1.Utsunomiya Univ.)

Keywords:real contact area, glancing incident X-ray

The propagating path of glancing incident X-ray was investigated for the contact of the Al thin film on a substrate with the Au foil on a knife edge to detect contact between two metals. The propagating path was examined by measuring the profile of the exiting X-ray from the sample. A weak peak was found in the profile after getting the Au foil in the contact with the Al thin film. The detected angle for the weak peak corresponds to the expected angle of the X-ray refracted at the contact boundary between the Al thin film and the Au foil.