[24a-E101-1~7] 7.1 X-ray technologies

△ [24a-E101-2] Evaluation of X-ray spectroscopic performance of Backside Illuminated CMOS sensor for space application

〇Takeru Fujii¹, Junko S.Hiraga¹, Naoki Ogino², Daisuke Yonetoku², Makoto Arimoto², Tatsuya Sawano², Kensyo Sei³, Ayumi Yamamoto³, Takanori Sakamoto³, Hiroshi Nakajima⁴ (1.Kwansei Gakuin Univ., 2.Kanazawa Univ., 3.Aoyama Univ., 4.Kantou Gakuin Univ.)

Keywords:X-ray imaging spectroscopy, CMOS image senser, Photon counting

We have developed X-ray imaging spectroscopic detectors for the future X-ray astronomical mission. We employed a backilluminated CMOS image sensor, GSENSE400BSI(Gpixel Inc.) and evaluated X-ray spectroscopic performance.It was found that the lowest detectoable enegy is down to 0.2keV and the energy resolution at 5.9keV is as good as that obtained using well cooled X-ray CCDs, which used as standard X-ray detectors onboard currently active X-ray missions.We have also measured the detection effisiency on 3.0keV and obtained about 80 percent, which is high enough to realize our mission requirement.