[24a-E101-1~7] 7.1 X-ray technologies

[24a-E101-4] Measurement of Soft X-ray Appearance Potential Spectra of CeO₂

〇Takayuki Kashiwakura¹ (1.Utsunomiya Univ.)

Keywords:appearance potential spectroscopy, bulk sensitive, chemical state analysis

We made a soft x-ray appearance potential spectroscopy (SXAPS) equipment with an x-ray curved crystal monochromator. The SXAP spectrum measured for a CeO₂ powder sample at the Ce M₅ absorption edge shows an edge structure similar to that of XANES. We will analyze SXAP spectra incorporating the idea of spectrum analysis in the resonant inverse photoemission spectroscopy (RIPES).