The 69th JSAP Spring Meeting 2022

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[24p-E202-1~8] 7.1 X-ray technologies

Thu. Mar 24, 2022 1:30 PM - 3:30 PM E202 (E202)

Mitsunori Toyoda(Tokyo Polytechnic Univ.), Akio Yoneyama(SAGA Light Source)

2:45 PM - 3:00 PM

[24p-E202-6] Tensile test observation of polymer materials using X-ray Talbot interferometer

〇Ryosuke Ueda1, Kosuke Tsunoda1, Atsushi Momose1 (1.Tohoku Univ.)

Keywords:X-ray phase imaging, Tensile test, polymer material

X-ray phase imaging can be used to observe samples such as polymer materials and biological soft tissues with high sensitivity. Tensile tests are useful for understanding deformation and fracture phenomena of materials, and new insights are expected to be obtained by applying the X-ray phase imaging method. In this study, we observe the tensile test of polymer materials using X-ray Talbot interferometer. In the presentation, we will report the stress-strain curve of the polymer material and the transition of absorption, refraction, and scattering images until the specimen fracture by tensile force.