4:00 PM - 6:00 PM
[25p-P12-1] Structural analysis of expanded parallelogram shaped stacking fault in 4H-SiC epilayer
Keywords:SiC, 1SSF, Structural analysis
Presentation information
Poster presentation
15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)
[25p-P12-1~2] 15.6 Group IV Compound Semiconductors (SiC)
Fri. Mar 25, 2022 4:00 PM - 6:00 PM P12 (Poster)