[26a-E206-1~5] 6.5 Surface Physics, Vacuum

[26a-E206-2] Vacuum electrochemical measurement with ionic liquid for capping layer of EuO epitaxial thin films

〇Kenichi Kaminaga¹, Yoshihito Sano¹, Shingo Maruyama¹, Yuji Matsumoto¹ (1.Tohoku Univ.)

Keywords:Electrochemistry, PLD, EuO

EuO is a ferromagnetic semiconductor with saturation magnetization of 7 μB/Eu, but it has the disadvantage of high reactivity with oxygen and water. Previously, 5 nm thick amorphous alumina has been introduced as a surface capping layer and its properties have been evaluated under atmospheric exposure, but investigation of the capping layer itself, such as its thickness, has been insufficient. In this study, we report the electrochemical investigation of the effect of capping layer for EuO by using the apparatus developed by our laboratory, which enables us to perform all processes from thin film sample preparation to electrochemical measurement in a vacuum.