The 69th JSAP Spring Meeting 2022

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[26a-E302-1~11] 3.8 Optical measurement, instrumentation, and sensor

Sat. Mar 26, 2022 9:00 AM - 12:00 PM E302 (E302)

Takashi Kato(UEC), Minoru Tanabe(AIST)

9:00 AM - 9:15 AM

[26a-E302-1] 1550 nm polarization probe-type polarization imaging by using polarization grating

〇(M2)NHAN THANH HUYNH1, Moritsugu Sakamoto1,4, Kohei Noda1,4, Tomoyuki Sasaki1,4, Masayuki Tanaka2, Nobuhiro Kawatsuki3,4, Hiroshi Ono1,4 (1.Nagaoka Univ., 2.OPT Gate Co.LTD, 3.Univ. of Hyogo, 4.CREST, JST)

Keywords:Polarization imaging, Polarization grating, 1550 nm

A Near-IR 1550 nm polarization probe-type polarization imaging by using polarization grating has been developed. We have conducted demonstration experiments of the PPPI system using near-infrared light with a wavelength of 976 nm and succeeded in finding some usefulness in inspection applications. We report the results of a new attempt at PPPI in the 1550 nm band with the purpose of increasing the wavelength.