Chihiro Kojima

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Speaker, Author, Co-Author

Fri. Mar 17, 2023 1:00 PM - 6:00 PM A301 (Building No. 6)

Oral presentation
| 13 Semiconductors
| 13.7 Compound and power devices, process technology and characterization

[17p-A301-1~18] 13.7 Compound and power devices, process technology and characterization

2:45 PM - 3:00 PM

[17p-A301-7] Hall effect measurement of defect levels introduced by 137 keV electron beam irradiation in homoepitaxial n-type GaN

〇Chihiro Kojima¹, Masahiro Horita^1,2, Jun Suda^1,2 (1.Nagoya Univ., 2.Nagoya Univ. IMaSS)