Yuki Sakishita

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Speaker, Author, Co-Author

Sat. Mar 18, 2023 9:00 AM - 11:30 AM A401 (Building No. 6)

Oral presentation
| 23 Joint Session N "Informatics"
| 23.1 Joint Session N "Informatics"

[18a-A401-1~9] 23.1 Joint Session N "Informatics"

10:30 AM - 10:45 AM

[18a-A401-6] Combined Bayesian analysis of measurements of thin film X-ray diffractometry and X-ray reflectometry

〇(DC)Yuki Sakishita¹, Huyuki Nabeshima¹, Atsutaka Maeda¹, Koji Hukushima^1,2 (1.Dept. of Basic Sci., Univ. of Tokyo, 2.Komaba Inst. for Sci., Univ. of Tokyo)

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