[16p-D519-1~15] CS.1 Code-sharing Session of 2.3 & 7.4 &7.5

[16p-D519-1] Secondary electron emission from self-supporting graphene films by swift cluster ion beam irradiation

〇(M1)Naruki Uno¹, Takuya Majima¹, Manabu Saito¹, Hidetsugu Tsuchida¹ (1.Kyoto Univ.)

Keywords:swift cluster-ion projectiles, Energy of secondary electron

It is known that when a substance is irradiated with a swift cluster ion beam, a high density of energy that contributes to ionization is imparted to its tracks.Generally, the secondary electron emission from the surface consists of three processes: secondary electron generation in materials, transport, and surface escape. The generation process is related to cluster ions' energy transfer to the substance. In this study, we used single-layer graphene as the target material to eliminate the influence of the transport and surface escape processes in the secondary electron emission process.We show the energy distribution of secondary electrons emitted from monolayer graphene under 0.6 MeV/atom Si+ bombardment.