[16p-PA10-1~11] 6.6 Probe Microscopy

[16p-PA10-1] Development of time reduction SPM with compressed sensing

〇Keiichi Ueda^1,2, Zhuo Diao², Linfeng Hou², Hayato Yamashita², Masayuki Abe² (1.TIRI, 2.Osaka Univ.)

Keywords:Scanning Probe Microscopy, Scanning Tunneling Microscopy, Atomic Force Microscopy

In scanning probe microscope (SPM) experiments, it is known that surface image acquisition takes a lot of time. In this study, we implemented an SPM that reduces the surface image acquisition time by applying compressed sensing, and demonstrated it experimentally.