[18a-A401-1~9] 23.1 Joint Session N "Informatics"

[18a-A401-7] Development of a fully automated quantitative analysis system using powder X-ray diffraction and Raman spectroscopy

〇MASATO OKAWACHI¹, Yasuo Takeichi¹, Yusaku Nakajima¹, Takafumi Hawai¹, Kanta Ono¹ (1.Osaka Univ.)

Keywords:laboratory automation

Rietveld analysis of powder X-ray diffraction data is one of the most common methods for quantitative analysis. However, analysis of multiphase systems is time-consuming due to the large number of parameters to be refined. In this study, we combined Raman spectroscopy, a high-throughput method that allows qualitative and semi-quantitative analysis with X-ray diffraction. Furthermore, by applying the automated Rietveld analysis method BBO-Rietveld, we have developed an integrated system that can perform measurement and analysis automatically with high time resolution.