<strong>Invited Talk : Reliability analysis of electronic devices by Synchrotron X-ray CT</strong>

Presentation information

Special Session » Materials Development for Electronic Components in the DX/GX Era

Fri. Oct 20, 2023 9:00 AM - 10:20 AM Room II (Clover Hall)

Chairperson:Kenji KAWAGUCHI(National Institute of Advanced Industrial Science and Technology（AIST）)

9:00 AM - 9:20 AM

*Gaku OKUMA^1,2, Fumihiro WAKAI^1,2 (1. National Institute for Materials Science, 2. Tokyo Institute of Technology)

Keywords:Sintering, microstructure, X-ray computed tomography, MLCC

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