[2Da] 表面分析・応用表面科学・評価技術(ASS)

[2Da04S] Development of method analyzing multiple core-level XPS spectral data using reference spectra

○村上諒¹⁾，庄野逸¹⁾，永田賢二²⁾，篠塚寛志²⁾，吉川英樹²⁾ (¹⁾電通大，²⁾物材機構)