[1Ap01-15] 表面分析研究部会「最近の表面分析いろいろ」

[1Ap04] In Situ/Operando XPS Measurements

*Takuya Masuda¹ (1. National Institute for Materials Science)

We have developed a novel XPS system integrated with an environment cell, a bias application module and a non-air exposure sample transfer vessel for in situ/operando measurements of liquid samples, solid/liquid and solid/solid interfaces using a conventional laboratory-based apparatus. A few examples such as quantitative detection of solution species and reaction analysis of electrochemical lithiation/delithiation of a silicon negative electrode deposited on a solid electrolyte will be presented.