[2Bp02-12] マイクロビームアナリシス技術部会

[2Bp10] Elimination of the charging effect in NAP-HAXPES by gas introduction

Kento Takenaka¹, Kenta Adachi¹, Koji Takahara², Hirosuke Sumida³, *satoru suzuki² (1. School of Science, University of Hyogo, 2. LASTI, University of Hyogo, 3. Mazda Corporation)

By introducing gas into a near-ambient pressure hard X-ray photoelectron spectroscopy (NAP-HAXPES) apparatus, the charging effect of insulator samples such as a glass plate could be almost completely eliminated. Furthermore, it was clarified that the gas pressure required for charge elimination strongly depends on the distance between the sample and the front cone of the HiPP-2 analyzer.