Oral Presentation

[1Cp01-07] Surface Analysis/Applied Surface Science/Evaluation Technique (ASS)

Tue. Oct 31, 2023 2:00 PM - 4:15 PM C: Room234 (3F)

Chair:Yan Jun Li(Osaka University), Kenji Murakami(Shizuoka University)

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2:00 PM - 2:30 PM

[1Cp01(2023技術賞)] Development of a novel soft X-ray second harmonic generation detection system and its application

*Toshihide Sumi¹, Masafumi Horio¹, Tomoaki Senoo¹, Tetsuya Wada¹, Yuki Tsujikawa¹, Xiaoni Zhang¹, Paul Manset², Mihoko Araki¹, Yasuyuki Hirata³, Walter S. Drisdell^4,5, John W. Freeland⁶, Angelique Amado^7,8, Michael Zuerch^7,8,9, Yuya Kubota¹⁰, Shigeki Owada^10,11, Kensuke Tono^10,11, Makina Yabashi^10,11, Craig P. Schwartz^4,12, Iwao Matsuda^1,13 (1. The Institute for Solid State Physics, The University of Tokyo, 2. Ecole Normale Superieure de Parise, 3. National Defense Academy of Japan, 4. Chemical Sciences Division, Lawrence Berkeley National Laboratory, 5. Joint Center for Artificial Photosynthesis, Lawrence Berkeley National Laboratory, 6. Advanced Photon Source, Argonne National Laboratory, 7. Department of Chemistry, University of California, Berkeley, 8. Materials Sciences Division, Lawrence Berkeley National Laboratory, 9. Fritz Haber Institute of the Max Planck Society, 10. RIKEN SPring-8 Center, 11. Japan Synchrotron Radiation Research Institute, 12. Nevada Extreme Conditions Laboratory, University of Nevada, 13. Trans-scale Quantum Science Institute, The University of Tokyo)

2:30 PM - 2:45 PM

[1Cp02] Measurement of interface state density on pn-paterned Si surface using high- and low-frequency Kelvin probe force spectroscopy

*Yasuhiro Sugawara¹, Ryo Izumi¹, Masato Miyazaki¹, Yan Jun Li¹ (1. Graduate School of Engineering, Osaka University)

2:45 PM - 3:00 PM

[1Cp03] Evaluation of high-resolution spectra extracted from cube data measured by spectrum imaging method of AES

*Kenichi Tsutsumi¹, Konomi Ikita¹, Tatsuya Uchida¹, Kazushiro Yokouchi¹, Akihiro Tanaka¹, Toshiyuki Ohama¹, Noboru Taguchi² (1. JEOL Ltd., 2. National Institute of Advanced Industrial Science and Technology (AIST))

3:00 PM - 3:15 PM

[1Cp04] Multimodal valence band photoelectron spectroscopy by SX-VUV dual beam momentum microscope

*Fumihiko Matsui¹, Kenta Hagiwara¹, Eiken Nakamura¹, Shigemasa Suga² (1. Institute for Molecular Science, 2. SANKEN, Osaka University)

Break time (3:15 PM - 3:30 PM)

3:30 PM - 3:45 PM

[1Cp05] Development of new display analyzer CoDELMA and atom-holography microscope

*Hiroshi Daimon¹, Hiroki Momono², Hiroyuki Matsuda¹, Fumihiko Matsui¹, Laszlo Toth³, Yu Masuda⁴, Koichi Moriguchi⁴, Keiko Ogai⁴, Yusuke Hashimoto⁵, Tomohiro Matsushita⁵ (1. Institute for Molecular Science, 2. National Institute of Technology, Yonago, 3. SciTech Muszer Kft, 4. APCO Ltd., 5. Nara Institute of Science and Technology)

3:45 PM - 4:00 PM

[1Cp06] FIB-prepared clean microcrystal on solid substrate for surface spectroscopy

*Fumio Komori^1,2, Yanze Guan¹, Masafumi Horio¹, Atsushi Fukuda², Yuki Tsujikawa¹, Kenichi Ozawa³, Masao Kamiko², Daisuke Hamane¹, Taizo Kawauchi², Katsuyuki Fukutani², Yuki Tokumoto², Keiichi Edagawa², Ryuji Tamura⁴, Iwao Matsuda¹ (1. The Institute for Solid State Physics, The University of Tokyo, 2. Institute of Industrial Sceince, The University of Tokyo, 3. Institute of Materials Structure Science, High Energy Accelerator Research Organization, 4. Faculty of Advanced Engineering, Tokyo University of Science)

4:00 PM - 4:15 PM

[1Cp07] Estimation of diffusion-related parameters using genetic algorithm from desorption rates obtained from thermal desorption spectroscopy

*Shoji Yamaguchi¹, Satoshi Tomioka², Yuji Yamauchi², Yutaka Matsumoto², Naoki Higashi² (1. Graduate school of Engineering, Hokkaido University, 2. Faculty of Engineering, Hokkaido University)

Session information