部会セッション

[1Ep01-05] Development of Data Processing and Data Utilization in Surface Analysis: Surface Analysis Division's Session

2023年10月31日(火) 14:00 〜 16:45 中会議室222 (2階)

Chair:阿部芳巳(三菱ケミカル株式会社)

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14:00 〜 14:30

[1Ep01] Deciphering Material Histories: Estimating
Exposure Temperature and Fracture Causes through Microscopic Imaging

*Hayaru Shouno¹, Akihiro Endo², Kota Sawada², Yoshiyuki Furuya², Kenji Nagata², Hideki Yoshikawa² (1. The University of Electro-Communications, 2. National Institute for Material Science)

14:30 〜 15:00

[1Ep02] Data analysis contribution to the interpretation of complex data by surface analysis techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its future development.

*Satoka Aoyagi¹ (1. Seikei University)

15:00 〜 15:30

[1Ep03] Materials search method using high-throughput experimental screening and machine learning models

*Shin Tajima¹ (1. Toyota Central R&D Labs., Inc.)

休憩時間 (15:30 〜 15:45)

15:45 〜 16:15

[1Ep04] Introduction to sample structure prediction from XPS data using Bayesian estimation and SESSA Simulator

*Hiroshi Shinotsuka¹, Kenji Nagata¹, Malinda Siriwardana¹, Hideki Yoshikawa¹, Hayaru Shouno², Masato Okada³ (1. National Institute for Materials Science, 2. The University of Electro-Communications, 3. The University of Tokyo)

16:15 〜 16:45

[1Ep05] Optimization Strategies for Peak Area Measurement in Practical XPS Analysis

*Noriaki Sanada¹ (1. ULVAC-PHI, Inc.)

セッション情報

[1Ep01-05] Development of Data Processing and Data Utilization in Surface Analysis: Surface Analysis Division's Session

[1Ep01] Deciphering Material Histories: Estimating
Exposure Temperature and Fracture Causes through Microscopic Imaging

[1Ep02] Data analysis contribution to the interpretation of complex data by surface analysis techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its future development.

[1Ep03] Materials search method using high-throughput experimental screening and machine learning models

[1Ep04] Introduction to sample structure prediction from XPS data using Bayesian estimation and SESSA Simulator

[1Ep05] Optimization Strategies for Peak Area Measurement in Practical XPS Analysis

認証

セッション情報

[1Ep01-05] Development of Data Processing and Data Utilization in Surface Analysis: Surface Analysis Division's Session

[1Ep01] Deciphering Material Histories: EstimatingExposure Temperature and Fracture Causes through Microscopic Imaging

[1Ep02] Data analysis contribution to the interpretation of complex data by surface analysis techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its future development.

[1Ep03] Materials search method using high-throughput experimental screening and machine learning models

[1Ep04] Introduction to sample structure prediction from XPS data using Bayesian estimation and SESSA Simulator

[1Ep05] Optimization Strategies for Peak Area Measurement in Practical XPS Analysis

認証

[1Ep01] Deciphering Material Histories: Estimating
Exposure Temperature and Fracture Causes through Microscopic Imaging