2023年日本表面真空学会学術講演会

講演情報

部会セッション

[1Ep01-05] Development of Data Processing and Data Utilization in Surface Analysis: Surface Analysis Division's Session

2023年10月31日(火) 14:00 〜 16:45 中会議室222 (2階)

Chair:阿部 芳巳(三菱ケミカル株式会社)

14:30 〜 15:00

[1Ep02] Data analysis contribution to the interpretation of complex data by surface analysis techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its future development.

*Satoka Aoyagi1 (1. Seikei University)

Data analysis is crucial for the interpretation of complex data by sophisticated surface analysis techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS). I’d like to talk about machine learning contributions and its future development after I briefly introduce how multivariate analysis support the complex data interpretation. Data analysis learning methods are generally divided into three categories, unsupervised learning, supervised learning, and reinforcement learning. For the analysis of surface analysis data, unsupervised learning is mainly useful for extracting features including those related to unknown materials or unknown factors, while supervised learning is helpful for determination, identification and investigation of the relationship between the results by multiple methods. In addition, machine learning applications to other surface analysis techniques will also be introduced.

抄録パスワード認証
抄録の閲覧にはパスワードが必要です。パスワードを入力して認証してください。

パスワード