[1P35] Photoelectron spectroscopy study of amorphous carbon thin films as a function of annealing temperature
The electronic structure in amorphous carbon thin films as a function of annealing temperature was investigated by photoelectron spectroscopy. Before annealing, a broader peak at 285 eV was observed in the photoelectron spectroscopy spectrum of the C 1s core level. The photoelectron spectra of the C 1s core level became narrower with increasing annealing temperature. This indicates that the coordination of C atoms in amorphous carbon thin films was changed. By using the curve fitting analysis of the C 1s photoelectron spectroscopy spectra, the coordination of C atoms in amorphous carbon thin films was evaluated as a function of annealing temperature. In addition, the photoelectron spectra of the valence band region as a function of annealing temperature were also measured. In the presentation, the electronic structure of amorphous carbon thin films as a function of annealing temperature is discussed.
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