09:55 〜 10:20
[3Ia02] Structure determination of 2D materials using positron beam
Owing to the limited penetration depth of the positron beam into materials, total-reflection high-energy positron diffraction (TRHEPD) is useful for the structure determination of two-dimensional (2D) materials. In this talk, we will show the surface sensitivity of TRHEPD method, followed by the recent results (quasicrystal graphene, intercalated graphene, and so on) of the structure analysis by TRHEPD.
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