*Takahiro Inagaki¹, Kensuke Inaba¹, Timothée Leleu², Toshimori Honjo¹, Takuya Ikuta¹, Yasuhiro Yamada¹, Koji Enbutsu³, Takeshi Umeki³, Ryoichi Kasahara³, Kazuyuki Aihara², Hiroki Takesue¹ (1. NTT Basic Research Laboratories, 2. The University of Tokyo, 3. NTT Device Technology Laboratories)

*Takatomo Mihana¹, Kazutaka Kanno¹, Makoto Naruse², Atsushi Uchida¹ (1. Saitama Univ., 2. Univ. Tokyo)

*Kazutaka Kanno¹, Atsushi Uchida¹ (1. Saitama University)

*Yuki Miyata¹, Suguru Shimomura², Takahiro Nishimura³, kozuka jun³, Naoya Tate¹, Yusuke Ogura², Jun Tanida² (1. Faculty of Information Science and Electrical Engineering, Kyusyu University, 2. Graduate school of Information Science and Technology, Osaka University, 3. Graduate School of Engineering, Osaka University)

*Shunichi Sakai¹, Tadashi Kawazoe², Naoya Tate¹ (1. Graduate School and Faculty of Information Science and Electrical Engineering, Kyushu University, 2. Nichia Corporation)