15:15-17:15　ポスター発表（鉱物処理／リサイクル） ［9/11(水) PM ポスター発表会場］

[P056C] 次世代のMLA技術の紹介：新しい評価技術のタンタル鉱物への適用

○Salazar Zambrano Aldemar Leonardo¹、竹内 麻智¹、河野 翔¹、長谷川 誠二²、木村 正和² (1. サーモフィッシャーサイエンティフィック、2. JX金属株式会社)

キーワード：タンタル鉱物、走査型電子顕微鏡、エネルギー分散型X線分析、鉱物単体分離、鉱体評価

Tantalum, celebrated for its exceptional properties including high melting point, corrosion resistance, and superior electrical conductivity, stands as a critical metal pivotal in various high-tech applications spanning electronics, biomedical implants, aerospace components, and defence systems. However, tantalum's intricate mineralogy, primarily found in minerals like columbite-tantalite, microlite, and wodginite within granitic pegmatites, poses challenges for accurate characterization. Advanced techniques such as electron microprobe analysis and X-ray diffraction play indispensable roles in identifying tantalum-bearing minerals and understanding their distribution within host rocks. The emergence of Maps Min, integrating scanning electron microscopy with energy dispersive X-ray spectroscopy, represents a significant leap in tantalum mineralogy characterization. This technique offers comprehensive analyses encompassing mineral chemistry, texture, and spatial relationships, with high-resolution backscattered electron images aiding in capturing fine-scale features. Reports generated by Maps Min include elemental deportment, modal mineralogy, bulk chemistry, particle size distribution, and mineral liberation, facilitating precise ore body assessments and optimization of extraction techniques. Maps Min, building on the legacy of previous technologies, enhances mineralogical analysis efficiency and ease of use for researchers and industry professionals across mining, mineral processing, and geology fields.