Session information

OPTM2020

Oral Presentation

Session 5

Wed. Apr 22, 2020 12:50 PM - 3:30 PM 211 (Conference Center)

+Add all to schedule

1:30 PM - 2:10 PM

[OPTM5-02(Invited)] Design of a spectroscopic imaging ellipsometer

*Lianhua Jin¹, Makoto Uehara¹, Takashi Iwao¹, Yuki Iizuka¹, Eiichi Kondoh¹, Bernard Gelloz² (1. Univ.Yamanashi, 2. Nagoya University,)

2:10 PM - 2:30 PM

[OPTM5-03] Large scale thin film thickness uniformity extraction based on dynamic spectroscopic ellipsometry

*Daesuk Kim¹, Vamara Dembele¹, Inho Choi¹, Sukhyun Choi¹, Saeid Kheiryzadehkhanghah¹, Chung Song Kim¹ (1. Chonbuk National University)

2:30 PM - 2:50 PM

[OPTM5-04] Calibration methods for snapshot Mueller matrix spectropolarimetry

*Nathan Hagen¹, Yukitoshi Otani¹ (1. Utsunomiya University)

2:50 PM - 3:10 PM

[OPTM5-05] Birefringence Influence on Polarization Changes and Frequency on Optical Fiber Sensors

*Martin Kyselak², Jan Maschke², Marco Panasci², Karel Slavicek³, Otto Dostal³, David Grenar¹, Milan Cucka¹, Miloslav Filka¹ (1. Brno University of Technology, 2. University of Defense, 3. Masaryk University)

3:10 PM - 3:30 PM

[OPTM5-06] Fringe polarimetry enabled by the geometric phase: preliminary theory

*Luis Garza¹ (1. Tecnologico de Monterey)

Authentication

Abstract password authentication.
Password is required to view the abstract. Please enter a password to authenticate.

Please log in with your participant account.
» Participant Log In

▲