Self-Heating Influence on Hot Carrier Degradation Reliability of GAA FET by 3D KMC Method

Presentation information

Oral

Thu. Sep 28, 2023 9:00 AM - 11:30 AM Hall A

Chair: Hiu-Yung Wong (San Jose State Univ.), Nobuhiko Nakano (Keio Univ.)

9:50 AM - 10:10 AM

*Songhan Zhao¹, Pan Zhao¹, Yandong He¹, Gang Du¹ (1. School of Integrated Circuits, Peking University)

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