Bias Temperature Instability in Tunnel FETs

W. Mizubayashi

doi:https://doi.org/10.7567/SSDM.2016.A-6-01

2016 International Conference on Solid State Devices and Materials

Sep 26, 2016 - Sep 29, 2016
Tsukuba International Congress Center, Tsukuba, Japan

11:15 AM - 11:45 AM

[A-6-01(Invited)] Bias Temperature Instability in Tunnel FETs

^○W. Mizubayashi¹, T. Mori¹, K. Fukuda¹, Y. Ishikawa¹, Y. Morita¹, S. Migita¹, H. Ota¹, Y. X. Liu¹, S. O'uchi¹, J. Tsukada¹, H. Yamauchi¹, T. Matsukawa¹, M. Masahara¹, K. Endo¹ (1.AIST(Japan))

https://doi.org/10.7567/SSDM.2016.A-6-01

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