Performance Evaluation of III-V Nanowire Broken-Gap TFETs Including Electron-Phonon Scattering Using an Atomistic Mode Space NEGF Technique Enabling Million Atoms NW Simulations.

A. Afzalian

doi:https://doi.org/10.7567/SSDM.2017.E-3-01

9:30 AM - 10:00 AM

[E-3-01 (Invited)] Performance Evaluation of III-V Nanowire Broken-Gap TFETs Including Electron-Phonon Scattering Using an Atomistic Mode Space NEGF Technique Enabling Million Atoms NW Simulations.

^○A. Afzalian¹, T. Vasen¹, P. Ramvall¹, D. Lemus², T. Kubis², M. Passlack¹, T. -M. Shen³, J. Wu³ (1.TSMC, Leuven (Belgium), 2.Purdue Univ. (USA), 3.TSMC, Hsinchu (Taiwan))

https://doi.org/10.7567/SSDM.2017.E-3-01

2017 International Conference on Solid State Devices and Materials

[E-3-01 (Invited)] Performance Evaluation of III-V Nanowire Broken-Gap TFETs Including Electron-Phonon Scattering Using an Atomistic Mode Space NEGF Technique Enabling Million Atoms NW Simulations.