11:45 AM - 12:00 PM
[C-4-05 (Late News)] A Novel Experimental Approach to Extracting Negative Capacitances: Newly found Negative DIBL Effect in 14nm NC-FinFET and the Way to Achieve Hysteresis-free
Y.C. Luo1,○E.R. Hsieh2, C.J. Su3, S. Chung2, T.P. Chen4, S.A. Huang4, T.J. Chen4, O. Cheng4
(1.National Tsing Hua University (Taiwan), 2.National Chiao Tung University (Taiwan), 3.National NanoDevice Lab. (Taiwan), 4.UMC (Taiwan))
https://doi.org/10.7567/SSDM.2018.C-4-05