The Japan Society of Applied Physics

2:15 PM - 2:30 PM

[D-8-02] Double RESURF JTEs Structure for Low On-Resistance Trench Gate SiC MOSFET

Y. Saitoh1, T. Masuda1, H. Michikoshi1, H. Shiomi1, S. Harada1, Y. Mikamura2 (1.AIST (Japan), 2.Sumitomo Electric Industries, Ltd. (Japan))

https://doi.org/10.7567/SSDM.2018.D-8-02