An Assessment on Dynamic Physical Changes in Dielectric Thin Films:<br />A View Toward the Mechanism Behind The Resistive Switching

11:00 AM - 11:30 AM

[J-4-01 (Invited)] An Assessment on Dynamic Physical Changes in Dielectric Thin Films:
A View Toward the Mechanism Behind The Resistive Switching

〇Nobuhiko P. Kobayashi¹, John F. Sevic¹, and Foroozan S. Koushan¹ (1. University of California, Santa Cruz(United States of America))