〇Aiko Yamaguchi^1,2 (1. NEC Corp. (Japan), 2. AIST (Japan))

〇Keisuke Matsumoto¹, Aiko Yamaguchi^1,2, Tsuyoshi Yamamoto^1,2, Shiro Kawabata¹, Yuichiro Matsuzaki¹ (1. AIST (Japan), 2. NEC (Japan))

〇Tsuyoshi Takahashi^1,2, Norinao Kouma^1,2, Yoshiyasu Doi^1,2, Shintaro Sato^1,2, Shuhei Tamate², Yasunobu Nakamura^2,3 (1. Fujitsu Limited (Japan), 2. RIKEN (Japan), 3. Univ. of Tokyo (Japan))

〇Yoshiro Urade¹, Kunihiro Inomata¹, Kay Yakushiji¹, Manabu Tsujimoto¹, Takahiro Yamada¹, Wataru Mizubayashi¹ (1. AIST (Japan))

〇Katsuki Ura^1,2, Takashi Imoto¹, Tetsuro Nikuni², Shiro Kawabata¹, Yuichiro Matsuzaki¹ (1. AIST (Japan), 2. Tokyo Univercity of Science (Japan))

〇Yusuke Azuma¹, Hideyuki Watanabe², Satoshi Kashiwaya³, Shintaro Nomura¹ (1. Univ. of Tsukuba (Japan), 2. AIST (Japan), 3. Nagoya Univ. (Japan))

〇Toyofumi Ishikawa¹, Yasunori Mawatari¹, Satoshi Kashiwaya^1,2, Akio Yoshizawa¹, Hideyuki Watanabe¹ (1. National Institute of Advanced Industrial Science and Technology (AIST) (Japan), 2. Nagoya Univ. (Japan))