〇Po-Tsun Liu¹, Zhen-Hao Li¹, Tsung-Che Chiang¹, Hsin-Hua Lee¹, Chun-Hao Tu¹ (1. NYCU (Taiwan))

〇Ben Daniel Rowlinson¹, Jiale Zeng¹, Vasilieos Mourgelas¹, Christian Patzig², Lutz Berthold², Joshua Daniel Akrofi¹, Martin Ebert¹, Harold Chong¹ (1. Univ. of Southampton (UK), 2. Fraunhofer Inst. IMWS (Germany))

〇Xiao-Xi Li¹, Yu Sun², Yu-Chun Li¹, Rui Zhang², Chang-Tai Xia³, Ying-Guo Yang¹, Hong-Liang Lu¹ (1. Fudan Univ. (China), 2. Zhejiang Univ. (China), 3. Shanghai Inst. of Opt./Fine Mech., CAS (China))

〇Yu-Jin Hwang¹, Do-Kyung Kim¹, Sang-Hwa Jeon¹, Ziyuan Wang¹, Sin-Hyung Lee^1,2, In-Man Kang^1,2, Jaewan Jang^1,2, Jin-Hyuk Bae^1,2 (1. Eng of Electronic and electrical, Univ. of Kyungpook (Korea), 2. Eng of Electronics, Univ. of Kyungpook (Korea))

Yan-Kui Liang¹, 〇Wei-Li Lee¹, Jing-Wei Lin¹, Sih-Rong Wu¹, Tsung-Ying Yang¹, Li-Chi Peng¹, Tsung-Te Chou², Chi-Chung Kei², Edward-Yi Chang¹, Chun-Hsiung Lin¹ (1. National Yang Ming Chiao Tung University (Taiwan), 2. Taiwan Instrument Research Institute, National Applied Research Laboratories (Taiwan))

〇Kuan-Ju Zhou¹, Ting-Chang Chang¹, Simon M. Sze², Ya-Ting Chien¹, Po-Yu Yen¹ (1. National Sun Yat-Sen University (Taiwan), 2. University of National Yang Ming Chiao Tung (Taiwan))