Yasuo Nara¹, Yuto Ota¹, 〇Hideaki Tanimura², Hikaru Kawarazaki², Shin'ichi Kato² (1. Univ. of Hyogo (Japan), 2. SCREEN Semiconductor Solutions Co., Ltd. (Japan))

〇Shigehisa Shibayama¹, Jotaro Nagano¹, Mitsuo Sakashita¹, Osamu Nakatsuka^1,2 (1. Nagoya Univ. (Japan), 2. IMaSS, Nagoya Univ. (Japan))

〇Danyang Chen¹, Tianning Cui¹, Shuman Zhong¹, Liying Wu¹, Jingquan Liu¹, Mengwei Si¹, Xiuyan Li¹ (1. Shanghai Jiao Tong Univ. (China))

Zhao-Feng LOU¹, Chun-Yu Liao¹, Kuo-Yu Hsiang^1,2, Chen-Ying Lin¹, Jia-Yang Lee¹, Pin-Huan Chen³, Wei-Chang Ray¹, Zhi-Xian Li¹, Han-Chen Tseng¹, Fu-Sheng Chang¹, Chun-Chieh Wang¹, Jeng-Han Tsai³, Ming-Han Liao⁴, 〇Min-Hung Lee¹ (1. Inst. and Undergraduate Program of Electro-Optical Engineering, National Taiwan Normal Univ. (Taiwan), 2. Department of Electronics Engineering, National Yang Ming Chiao Tung Univ. (Taiwan), 3. Department of Electrical Engineering, National Taiwan Normal Univ. (Taiwan), 4. Department of Mechanical Engineering, National Taiwan Univ. (Taiwan))