2:00 PM - 2:30 PM
[B-2-01 (Invited)] Metrology to Support Processing and Development of 4H-SiC CMOS and Power Devices at Fraunhofer IISB from Research to Multi Project Wafer Services
Presentation style: Online
https://doi.org/10.7567/SSDM.2022.B-2-01
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