[D-6] Functional Devices and Application

[D-6-06] Efficient OTFT Array Measurement for the Long-Term Reliability Evaluation using External Measurement Board

〇Yasuhiro Ogasahara¹, Kazunori Kuribara¹, Takashi Sato² (1. National Inst. of Advanced Indus. Sci. and Tech. (AIST) (Japan), 2. Kyoto University (Japan))

Presentation style: On-site (in-person)

https://doi.org/10.7567/SSDM.2022.D-6-06

Abstract— We propose an efficient many-element measurement system for long-term reliability evaluation of organic thin-film-transistor (OTFT). Based on the silicon transistor array measurement method, we designed a dedicated printed circuit board for measurement, and constructed the array measurement system of OTFT. The proposed measurement system can measure the OTFT array in (sweep time of source measure unit) × (number of OTFTs) period, and took 17 minutes for 17 pOTFTs (502 point/sweep, 3 Vds and 3 Vgs sweep conditions) in trial experiment.