11:15 〜 11:30
[F-5-02] Analysis of Grain Boundary Effect in GIDL-erase-scheme Vertical CTF Strings for High Stacked CMOS under Array 3-D NAND Flash
Presentation style: Online
https://doi.org/10.7567/SSDM.2022.F-5-02
Abstract password authentication.
Password to download abstracts has been informed in the confirmation mail.